Intel Xeon W-3175X is based on the Skylake SP architecture. The total of cores is 28 with the threads of 56. The operating base core clock is 3.10 GHz. Turbo-boost is 3.80 GHz (per-core). The technology node is 14 nm. L2 Cache is --, L3 Cache is 38.50 MB.
Intel Xeon W-3175X supports the socket type of LGA 3647.
The supported type and memory clock is DDR4-2666 MHz. The maximum RAM capacity is 512 GB. The date of release is - Q4/2018.
The official technical specifications of the Intel Xeon W-3175X CPU allow defining to what extent it is fast and efficient in the process and which system requirements for games and operational apps it can fit. Please learn the specs and benchmark results.
Technical specs
| Frequency: | 3.10 GHz | CPU Cores: | 28 | |
| Turbo (1 Core): | 3.80 GHz | CPU Threads: | 56 | |
| Hyperthreading: | Yes | Overclocking: | Yes | |
| Core architecture: | normal | A core: | 0x | |
| B core: | 0x | Turbo (28 Cores): | 3.80 GHz |
| GPU (Turbo): | No turbo | Max. Memory: | -- |
| h264: | No | |||
| JPEG: | No | |||
| VP8: | No | |||
| VP9: | No | |||
| VC-1: | No | |||
| AVC: | No | |||
| h265 / HEVC (8 bit): | No | |||
| h265 / HEVC (10 bit): | No | |||
| AV1: | No | |||
| Memory type: | DDR4-2666 | Max. Memory: | 512 GB | |
| Memory channels: | 6 | ECC: | Yes | |
| PCIe version: | 3.0 | PCIe lanes: | 48 |
| AES-NI: | Yes |
| Tjunction max.: | 85 °C | TDP up: | -- | |
| TDP down: | -- | TDP (PL1): | 255 W | |
| TDP (PL2): | -- |
| L3-Cache: | 38.50 MB | Technology: | 14 nm | |
| Architecture: | Skylake SP | Virtualization: | VT-x, VT-x EPT, VT-d, vPro | |
| Socket: | LGA 3647 | Release date: | Q4/2018 | |
| Market price: | ca. 2999 $ | Instruction set (ISA): | x86-64 (64 bit) | |
| L2-Cache: | -- |
| Used in: | Unknown | |||
Please learn the testing results of the Intel Xeon W-3175X CPU in synthetic benchmarks. These data can define the closest competitor and its current position in the models’ rating. Here are points in modern benchmarks, in which Intel Xeon W-3175X has been tested. Pay attention that the data can differ in testing systems.
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